SM-HPC-300 Wafer High-Pressure Cleaning Machine
Product Model:
SM-HPC-300
Product Description
This equipment is a high-precision, high-performance wet-processing device used in semiconductor manufacturing, particularly in the fields of advanced packaging and wafer-level packaging. It is applied for flux and particle cleaning in bumping processes, and can also be used for bottom-gap flux and particle cleaning in CoWoS applications.
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Product Details
Device features:
1. Achieves excellent cleaning performance when used with hot deionized water, two-fluid systems, ultra-pure CO₂ water, and N₂.
2. Specially designed high-pressure nozzles that do not damage delicate structures on the wafer surface, such as copper pillars and solder balls.
3. Dual-arm manipulator and dual chamfering device to improve cleaning UPH.
4. The nozzle pressure can reach up to 4,000 PSI and the angle is adjustable.
5. Compatible with 8/12-inch wafers
6. Compatible with AGV & OHT, and supports SECS/GEM connectivity.
Device parameters
| Basic Information | Double-chamber or quad-chamber | Hourly capacity | ≥24 pieces/hour/cavity |
| Loading and unloading device | Open-box wafer boxes, FOUPs, SMIFs, etc. | Process flow | HPC, Soft Spraying, HDI, Nitrogen Treatment |
| Robotic arm | Single-unit dual-arm robotic arm | Drying method | Nitrogen drying, rotary drying |
| Wafer size | 6 to 12 inches | Equipment utilization | 95% |
| Wafer thickness | Standard thickness | Wafer breakage rate | Less than 1/20,000 |
| Chuck | Vacuum Chuck / Clamp-Type Chuck | Equipment footprint | 1850 mm long × 1992 mm wide × 1943 mm high (excluding air intake and exhaust) |